Designer's Guide to Testable Asic Devices

by Wayne M. Needham

Springer | January 10, 1991 | Hardcover

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While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation(c) 2003 Book News, Inc., Portland, OR (booknews.com)

Format: Hardcover

Dimensions: 298 pages, 9.02 × 5.98 × 0.39 in

Published: January 10, 1991

Publisher: Springer

The following ISBNs are associated with this title:

ISBN - 10: 0442002211

ISBN - 13: 9780442002213

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– More About This Product –

Designer's Guide to Testable Asic Devices

by Wayne M. Needham

Format: Hardcover

Dimensions: 298 pages, 9.02 × 5.98 × 0.39 in

Published: January 10, 1991

Publisher: Springer

The following ISBNs are associated with this title:

ISBN - 10: 0442002211

ISBN - 13: 9780442002213

From the Publisher

While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation(c) 2003 Book News, Inc., Portland, OR (booknews.com)
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