Reliability Prediction From Burn-in Data Fit to Reliability Models

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Reliability Prediction From Burn-in Data Fit to Reliability Models

by Joseph Bernstein

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Format: Paperback

Publisher: Academic Press

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The following ISBNs are associated with this title:

ISBN - 10: 0128007478

ISBN - 13: 9780128007471

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New copy In stock and despatched from the UK. NB: All orders from the USA and Canada have to be sent via the Alibris depot in the UK and are then sent to the customer by Alibris in the USA. Until the book is received in the USA Alibris warehouse your order will show as Pending. Expected delivery dates are contained in the Help section of this site and in the confirmation email.

From the Publisher

This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. " The ability to include reliability calculations and test results in their product design" The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions" Have accurate failure rate calculations for calculating warrantee period replacement costs.

Used books: 4 more copies of this item are available

Reliability Prediction from Burn-In Data Fit to Reliability Models

Reliability Prediction from Burn-In Data Fit to Reliability Models

by Joseph Bernstein

Availability: Ships within 1 week

Condition:

Format: Trade paperback

Publisher: Academic Press

Seller Comments:

Trade paperback (US). Glued binding. 108 p. Contains: Illustrations, black & white.

$72.02

Reliability Prediction From Burn-in Data Fit to Reliability Models

Reliability Prediction From Burn-in Data Fit to Reliability Models

by Joseph Bernstein

Availability: Ships within 1 week

Condition:

Format:

Publisher: Academic Press

Seller Comments:

2014. 1st Edition. Paperback......We ship daily from our warehouse.

$80.65

Reliability Prediction from Burn-In Data Fit to Reliability Models

Reliability Prediction from Burn-In Data Fit to Reliability Models

by Joseph Bernstein

Availability: Ships within 1 week

Condition:

Format: Trade paperback

Publisher: Academic Press

Seller Comments:

Trade paperback (US). Glued binding. 108 p. Contains: Illustrations, black & white.

$84.04

Reliability Prediction from Burn-In Data Fit to Reliability Models

Reliability Prediction from Burn-In Data Fit to Reliability Models

by Joseph Bernstein

Availability: Ships within 1 week

Condition:

Format: Trade paperback

Publisher: Academic Press

Seller Comments:

Trade paperback (US). Glued binding. 108 p. Contains: Illustrations, black & white.

$85.41

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