A Probabilistic Theory of Pattern Recognition: PROBABILISTIC THEORY OF PATTER by Luc DevroyeA Probabilistic Theory of Pattern Recognition: PROBABILISTIC THEORY OF PATTER by Luc Devroye

A Probabilistic Theory of Pattern Recognition: PROBABILISTIC THEORY OF PATTER

byLuc Devroye, Laszlo Györfi, Gabor Lugosi

Hardcover | February 20, 1997

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A self-contained and coherent account of probabilistic techniques, covering: distance measures, kernel rules, nearest neighbour rules, Vapnik-Chervonenkis theory, parametric classification, and feature extraction. Each chapter concludes with problems and exercises to further the readers understanding. Both research workers and graduate students will benefit from this wide-ranging and up-to-date account of a fast- moving field.
Title:A Probabilistic Theory of Pattern Recognition: PROBABILISTIC THEORY OF PATTERFormat:HardcoverDimensions:660 pagesPublished:February 20, 1997Publisher:Springer New York

The following ISBNs are associated with this title:

ISBN - 10:0387946187

ISBN - 13:9780387946184

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Table of Contents

Preface * Introduction * The Bayes Error * Inequalities and alternate distance measures * Linear discrimination * Nearest neighbor rules * Consistency * Slow rates of convergence Error estimation * The regular histogram rule * Kernel rules Consistency of the k-nearest neighbor rule * Vapnik-Chervonenkis theory * Combinatorial aspects of Vapnik-Chervonenkis theory * Lower bounds for empirical classifier selection * The maximum likelihood principle * Parametric classification * Generalized linear discrimination * Complexity regularization * Condensed and edited nearest neighbor rules * Tree classifiers * Data-dependent partitioning * Splitting the data * The resubstitution estimate * Deleted estimates of the error probability * Automatic kernel rules * Automatic nearest neighbor rules * Hypercubes and discrete spaces * Epsilon entropy and totally bounded sets * Uniform laws of large numbers * Neural networks * Other error estimates * Feature extraction * Appendix * Notation * References * Index

From Our Editors

Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, tree classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.