Advanced Tomographic Methods in Materials Research and Engineering

Hardcover | March 20, 2008

EditorJohn Banhart

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Tomography provides three-dimensional images of heterogeneous materials or engineering components, and offers an unprecedented insight into their internal structure. By using X-rays generated by synchrotrons, neutrons from nuclear reactors, or electrons provided by transmission electronmicroscopes, hitherto invisible structures can be revealed which are not accessible to conventional tomography based on X-ray tubes.This book is mainly written for applied physicists, materials scientists and engineers. It provides detailed descriptions of the recent developments in this field, especially the extension of tomography to materials research and engineering. The book is grouped into four parts: a generalintroduction into the principles of tomography, image analysis and the interactions between radiation and matter, and one part each for synchrotron X-ray tomography, neutron tomography, and electron tomography. Within these parts, individual chapters written by different authors describe importantversions of tomography, and also provide examples of applications to demonstrate the capacity of the methods. The accompanying CD-ROM contains some typical data sets and programs to reconstruct, analyse and visualise the three-dimensional data.

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Tomography provides three-dimensional images of heterogeneous materials or engineering components, and offers an unprecedented insight into their internal structure. By using X-rays generated by synchrotrons, neutrons from nuclear reactors, or electrons provided by transmission electronmicroscopes, hitherto invisible structures can be ...

John Banhart - Editor Professor for Materials Science at Technical University Berlin and Head of the Department of Materials Research at Hahn-Meitner Institute Berlin 1984: Degree in Physics, University of Munich 1989: PhD in Physical Chemistry, University of Munich 1990: Postdoc at University of Vienna 1998: Habilitatio...

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Format:HardcoverDimensions:480 pages, 9.21 × 6.14 × 0.98 inPublished:March 20, 2008Publisher:Oxford University PressLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0199213240

ISBN - 13:9780199213245

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Table of Contents

1. Introduction2. Some Mathematical Concepts for Tomographic Reconstruction3. Visualisation, Processing and Analysis of Tomographic Data4. Radiation Sources and Interaction of Radiation with Matter5. Synchrotron X-ray Absorption Tomography6. Phase Contrast and Holographic Tomography7. Tomography using magnifying optics8. Scanning Tomography9. Three-dimensional X-ray Diffraction10. Detectors for Synchrotron Tomography11. Fundamentals of Electron Tomography12. Applications of Electron Tomography13. Neutron Absorption Tomography14. Neutron Phase Contrast and Polarised Neutron Tomography15. Neutron Refraction and Small-Angle Scattering TomographyAppendix A: Facilities for TomographyAppendix B: Examples on CDROM