Advances In Electronic Testing: Challenges And Methodologies by Dimitris GizopoulosAdvances In Electronic Testing: Challenges And Methodologies by Dimitris Gizopoulos

Advances In Electronic Testing: Challenges And Methodologies

EditorDimitris Gizopoulos

Hardcover | November 30, 2006

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This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Title:Advances In Electronic Testing: Challenges And MethodologiesFormat:HardcoverDimensions:437 pages, 9.45 × 6.3 × 0.03 inPublished:November 30, 2006Publisher:Springer USLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0387294082

ISBN - 13:9780387294087

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Table of Contents

Foreword by Vishwani D. AgrawalPreface by Dimitris GizopoulosContributing Authors Dedication Chapter 1-Defect-Oriented Testing by Robert C. Aitken1.1 History of Defect-Oriented Testing 1.2 Classic Defect Mechanisms 1.3 Defect Mechanisms in Advanced Technologies 1.4 Defects and Faults 1.5 Defect-Oriented Test Types 1.6 Experimental Results 1.7 Future Trends and Conclusions Acknowledgments References Chapter 2-Failure Mechanisms and Testing in Nanometer Technologies by Jaume Segura, Charles Hawkins and Jerry Soden2.1 Scaling CMOS Technology 2.2 Failure Modes in Nanometer Technologies 2.3 Test Methods for Nanometer ICs 2.4 Conclusion References Chapter 3-Silicon Debug by Doug Josephson and Bob Gottlieb3.1 Introduction 3.2 Silicon Debug History 3.3 Silicon Debug Process 3.4 Debug Flow 3.5 Circuit Failures 3.6 A Case Study in Silicon Debug 3.7 Future Challenges for Silicon Debug 3.8 Conclusion Acknowledgements References Chapter 4-Delay Testing by Adam Cron4.1 Introduction 4.2 Delay Test Basics 4.3 Test Application 4.4 Delay Test Details 4.5 Vector Generation 4.6 Chip Design Constructs 4.7 ATE Requirements 4.8 Conclusions: Tests vs. Defects Acknowledgements References Chapter 5-High-Speed Digital Test Interfaces by Wolfgang Maichen5.1 New Concepts 5.2 Technology and Design Techniques 5.3 Characterization and Modeling 5.4 Outlook References Chapter 6-DFT-Oriented, Low-Cost Testers by Al Crouch and Geir Eide6.1 Introduction 6.2 Test Cost - the Chicken and the Low Cost Tester 6.3 Tester Use Models 6.4 Why and When is DFT Low Cost? 6.5 What does Low Cost have to do with the Tester? 6.6 Life, the Universe, and Everything References Recommended Reading Chapter 7-Embedded Cores and System-on-Chip Testing by Rubin Parekhji7.1 Embedded Cores and SOCs 7.2 Design and Test Paradigm with Cores and SOCs 7.3 DFT for Embedded Cores and SOCs 7.4 Test Access Mechanisms 7.5 ATPG for Embedded Cores and SOCs 7.6 SOC Test Modes 7.7 Design for At-speed Testing 7.8 Design for Memory and Logic BIST 7.9 Conclusion AcknowledgementsReferences Chapter 8-Embedded Memory Testing by R. Dean Adams8.1 Introduction 8.2 The Memory Design Under Test 8.3 Memory Faults 8.4 Memory Test Patterns 8.5 Self Test 8.6 Advanced Memories & Technologies 8.7 Conclusions References Chapter 9-Mixed-Signal Testing and DfT by Stephen Sunter9.1 A Brief History 9.2 The State of the Art 9.3 Advances in the Last 10 Years 9.4 Emerging Techniques and Directions 9.5 EDA Tools for Mixed-Signal Testing 9.6 Future Directions References Chapter 10-RF Testing by Randy Wolf, Mustapha Slamani, John Ferrario and Jayendra Bhagat10.1 Introduction 10.2 Testing RF ICs 10.3 RF Test Cost Reduction Factors 10.4 Test Hardware 10.5 Hardware Development Process 10.6 High Frequency Simulation Tools 10.7 Device Under Test Interface 10.8 ConclusionsAcknowledgements References Chapter 11-Loaded Board Testing by Kenneth P. Parker11.1 The Defect Space at Board Test 11.2 In-Circuit Test (ICT) 11.3 Loaded Board Inspection Systems 11.4 The Future of Board Test References Index

Editorial Reviews

"There is a definite need for documenting the advances in testing . I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [.] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [.] This latest addition to the Frontiers Series is destined to serve an important role."From the Foreword by Vishwani D. Agrawal, Consulting EditorFrontiers in Electronic Testing Book Series