Advances in Imaging and Electron Physics

Other | June 1, 2005

byHawkes, Peter W., Peter W. Hawkes

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Advances in Imaging and Electron Physicsmerges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Advances in Imaging and Electron Physicsmerges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, i...

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-...

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Format:OtherDimensions:296 pages, 1 × 1 × 1 inPublished:June 1, 2005Publisher:Academic PressLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0080458408

ISBN - 13:9780080458403

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Table of Contents

Chapter 1 - Circulant matrix representation of feature masks and its applications (PARK and CHA);

Chapter 2 - Phase problem and reference beam diffraction (SHEN);

Chapter 3 - Fractal encoding (VITULANO)

Chapter 4 - Morphologically debiassed classifier fusion: A tomography-theoretic approach (WINDRIDGE)