Advances in Imaging and Electron Physics

Other | June 1, 2005

byHawkes, Peter W., Peter W. Hawkes

not yet rated|write a review
Advances in Imaging and Electron Physicsmerges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Pricing and Purchase Info

$262.79 online
$341.21 list price (save 22%)
In stock online
Ships free on orders over $25

From the Publisher

Advances in Imaging and Electron Physicsmerges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, i...

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-...

other books by Hawkes, Peter W.

Advances in Electronics and Electron Physics
Advances in Electronics and Electron Physics

Kobo ebook|May 1 1994

$73.79 online$95.73list price(save 22%)
Advances in Electronics and Electron Physics
Advances in Electronics and Electron Physics

Kobo ebook|Feb 1 1995

$73.79 online$95.73list price(save 22%)
see all books by Hawkes, Peter W.
Format:OtherDimensions:352 pages, 1 × 1 × 1 inPublished:June 1, 2005Publisher:Academic PressLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0080458556

ISBN - 13:9780080458557

Customer Reviews of Advances in Imaging and Electron Physics

Reviews

Extra Content

Table of Contents

Chapter 1 - Real and Complex PDE Based Schemes for Image Shaprening and Enhancement (GILBOA, SOCHEN and ZEEVI);

Chapter 2 - The'S - State Model for Electron Channeling in High Resolution Electron Microscopyv(GEUENS and VAN DYCK);

Chapter 3 - Measurement of Electric Fields on Object Surface in an Emission Electron Microscope (NEPIJKO, SEDOV and SCHONHENSE)