Advances in Imaging and Electron Physics

Other | September 1, 2003

byHawkes, Peter W., Peter W. Hawkes

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The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.

The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

  • Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics
  • Presents theory and it's application in a practical sense, providing long awaited solutions and new findings
  • Provides a comprehensive overview of international congress proceedings and associated publications, as source material

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From the Publisher

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. The text bridges the gap between academic researchers and R&D designers by ad...

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-...

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Format:OtherDimensions:407 pages, 1 × 1 × 1 inPublished:September 1, 2003Publisher:Academic PressLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0080490077

ISBN - 13:9780080490076

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Table of Contents

Scanning Nonlinear Dielectric Microscopy; High Order Accurate Methods in Time-Domain Computational Electromagnetics; Pre filtering for Pattern Recognition Using Wavelet Transform and Neural Networks; Electron Optics and Electron Microscopy: Conference Proceedings and Abstracts as source Material.