Advances in Imaging and Electron Physics

Other | June 1, 2004

byHawkes, Peter W., Peter W. HawkesEditorHawkes

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The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding.


This book is essential reading for electrical engineers, applied mathematicians and robotics experts.

Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics

Presents theory and it's application in a practical sense, providing long awaited solutions and new findings

Bridges the gap between academic researchers and R&D designers by addressing and solving daily issues

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From the Publisher

The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding.This book is essential reading for electrical engineers, applied mathematicians and robotics experts.Emphasizes broad and in depth article collaborations between world-renowned scientists in the fie...

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-...

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Format:OtherDimensions:247 pages, 1 × 1 × 1 inPublished:June 1, 2004Publisher:Academic PressLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0080490093

ISBN - 13:9780080490090

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Table of Contents

Chapter 1 - Introduction to Hypergraph Theory and Its Use in Engineering and Image Processing (BRETTO);
Chapter 2 - Image Segmentation Using the Wigner-Ville Distribution (HORMIGO/CRISTOBAL);
Chapter 3 - Statistical and Deterministic Regularities: Utilization of Motion and Grouping in Biological and Artificial Visual Systems (KRUEGER/WORGOTTER);
Chapter 4 - The Hopping Electron Cathode for Cathode Ray Tubes (ROSINK et al)