Advances in Imaging and Electron Physics by Peter W. HawkesAdvances in Imaging and Electron Physics by Peter W. Hawkes

Advances in Imaging and Electron Physics

byPeter W. Hawkes, Peter W. Hawkes

Other | December 31, 2012

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field
Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-...
Title:Advances in Imaging and Electron PhysicsFormat:OtherDimensions:440 pages, 1 × 1 × 1 inPublished:December 31, 2012Publisher:Elsevier ScienceLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0123946352

ISBN - 13:9780123946355


Table of Contents

  1. Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence
  2. G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler

  3. Thermal Imaging in Medicine
  4. Lila Iznita Izhar and Maria Petrou

  5. Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review
  6. Jean-Michel Tualle

  7. Imaging Mass Spectrometry - Sample Preparation, Instrumentation and Applications
  8. Kamlesh Shrivas and Mitsutoshi Setou

  9. Transformation Optics
  10. Robert T. Thompson and Steven A. Cummer

  11. TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications
  12. Tobias Klein, Egbert Buhr and Carl Georg Frase

  13. Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics

M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah