Advances in Imaging and Electron Physics

Other | January 25, 2012

byPeter W. Hawkes, Peter W. Hawkes

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography,...

Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-...

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Advances in Imaging and Electron Physics
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Format:OtherDimensions:280 pages, 1 × 1 × 1 inPublished:January 25, 2012Publisher:Elsevier ScienceLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0123978432

ISBN - 13:9780123978431

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Table of Contents

  1. Precession Electron Diffraction A. S. Eggeman and P. A. Midgley
  2. Scanning Helium Ion Microscopy R. Hill, J. A. Notte, and L. Scipioni
  3. Signal reconstruction algorithm based on a single intensity in the Fresnel domain Hone-Ene Hwang, Pin Han
  4. Electron Microscopy Studies on Magnetic L10FePd Nanoparticles Kazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
  5. Fundamental aspects of Near Field Emission Scanning Electron Microscopy D. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis