Advances in Imaging and Electron Physics by Peter W. HawkesAdvances in Imaging and Electron Physics by Peter W. Hawkes

Advances in Imaging and Electron Physics

byPeter W. Hawkes, Peter W. Hawkes

Other | January 25, 2012

Pricing and Purchase Info

$210.39 online 
$263.00 list price save 20%
Earn 1,052 plum® points

Prices and offers may vary in store


In stock online

Ships free on orders over $25

Not available in stores


Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field
Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-...
Title:Advances in Imaging and Electron PhysicsFormat:OtherDimensions:280 pages, 1 × 1 × 1 inPublished:January 25, 2012Publisher:Elsevier ScienceLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0123978432

ISBN - 13:9780123978431


Table of Contents

  1. Precession Electron Diffraction A. S. Eggeman and P. A. Midgley
  2. Scanning Helium Ion Microscopy R. Hill, J. A. Notte, and L. Scipioni
  3. Signal reconstruction algorithm based on a single intensity in the Fresnel domain Hone-Ene Hwang, Pin Han
  4. Electron Microscopy Studies on Magnetic L10FePd Nanoparticles Kazuhisa Sato, Toyohiko J. Konno, Yoshihiko Hirotsu
  5. Fundamental aspects of Near Field Emission Scanning Electron Microscopy D. A. Zanin, H. Cabrera, L. De Pietro, M. Pikulski, M. Goldmann, U. Ramsperger, D. Pescia, J. P. Xanthakis