Advances in X-Ray Analysis: Volume 32


EditorCharles S. Barrett, J.V. Gilfrich, Ron Jenkins

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Format:HardcoverDimensions:708 pages, 10 × 7.01 × 0.27 inPublisher:Springer US

The following ISBNs are associated with this title:

ISBN - 10:0306432366

ISBN - 13:9780306432361

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