Advances in X-Ray Analysis: Volume 39 by John V. GilfrichAdvances in X-Ray Analysis: Volume 39 by John V. Gilfrich

Advances in X-Ray Analysis: Volume 39

EditorJohn V. Gilfrich, I. Cev Noyan, Ron Jenkins

Hardcover | January 31, 1998

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Proceedings of the July 1995 conference. One hundred papers describe important work in X-ray diffraction (XRD), reflectivity, and fluorescence. Topics include the evolution of X-ray instrumentation, techniques, and software; conditioning of X-ray beams and other developments in X-ray instrumentation; stress and strain determination by diffraction methods, peak broadening analysis; characterization of polymers, anorphous materials and organics by X-ray neutron scattering; precision, accuracy in XRD, phase analysis; characterization of thin films by X-ray diffraction and fluorescence; other applications of X-ray diffractions including high-temperature and non-ambient; total reflection XRF and trace analysis; and quantitative XRF data interpretation and other XRF applications. Annotation c. by Book News, Inc., Portland, Or.
Title:Advances in X-Ray Analysis: Volume 39Format:HardcoverDimensions:926 pages, 10 × 7.01 × 0.03 inPublished:January 31, 1998Publisher:Springer US

The following ISBNs are associated with this title:

ISBN - 10:0306458039

ISBN - 13:9780306458033

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Table of Contents

Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry; J.L. de Vries. Conditoning of X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction; M. Schuster, H. Gobel. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction; V. Hauk. Characterization of Polymers, Amorphous Materials and Organics by X-Ray Neutron Scattering: Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers; N.S. Murthy. Precision, Accuracy in XRD, Phase Analysis: Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples; V. Valvoda, et al. Characterization of Thin Films by X-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in Thin Films; I.C. Noyan, C.C. Goldsmith. Other Applications of X-Ray Diffractions Including High-Temperature and Nonambient: Total Reflection XRF and Trace Analysis: Quantitative ZRF Data Interpretation and Other XRF Applications. 95 Additional Articles. Index.