An External Interface for Processing 3-D Holographic and X-Ray Images by Werner JüptnerAn External Interface for Processing 3-D Holographic and X-Ray Images by Werner Jüptner

An External Interface for Processing 3-D Holographic and X-Ray Images

EditorWerner Jüptner, Thomas Kreis

Paperback | May 10, 1989

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Internationally recognized experts in the field of holographic interferometric testing, X-ray testing, and structural analysis by finite element techniques have come together in ESPRIT project 898 to develop a system that integrates these techniques. This system acts as an external interface between the complementary nondestructive testing methods and computer based structural analysis. In the book the testing and analysis techniques are presented and compared with special emphasis on problems regarding their combination and integration. The architecture and the components of the interface system are described. Experiments proving the feasibility and applicability of the concepts are presented. The chapters of the book dealing with the different techniques are written by the individual partners of the project. A common test object is investigated by all techniques. The book helps the customer to select the testing and analysis method most suitable for his problem. It also presents the background for building up integrated testing equipment for analysis and control.
Title:An External Interface for Processing 3-D Holographic and X-Ray ImagesFormat:PaperbackDimensions:156 pagesPublished:May 10, 1989Publisher:Springer Berlin HeidelbergLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:3540508228

ISBN - 13:9783540508229

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Table of Contents

1 Introduction.- 1.1 General objectives of ESPRIT project 898.- 1.2 Size and extent of ESPRIT project 898.- 1.3 Roles of the partners of ESPRIT project 898.- 2 Aim of ESPRIT project 898.- 2.1 Holographic interferometry and X-ray radiography: complementary methods.- 2.2 Combined holographic interferometry and X-ray radiography.- 2.3 Architecture of the external interface system.- 3 Deformation measurement by holographic interferometry.- 3.1 Theoretical foundations of holographic interferometry.- 3.2 Structures to be tested holographically.- 3.3 Loading of the structures.- 3.4 Quantitative evaluation of holographic interference patterns.- 3.5 Techniques of quantitative holographic interferometry.- 3.6 Evaluation of holographic interference patterns by the phase step method.- 3.7 Evaluation of holographic interference patterns by the Fourier-transform method.- 3.8 References.- 4 Structural and stress analysis.- 4.1 Analysis methods.- 4.2 The Finite Element program MELINA.- 4.3 Interpolation of holographic data.- 4.4 Software for interpolation and verification.- 4.5 Data formaf for representation of holographic images.- 4.6 Preparation for analysis.- 4.7 Analysis of honeycomb panel.- 5 Component inspection by X-ray radiography.- 5.1 Introduction to X-ray radiography.- 5.2 X-ray inspection system hardware.- 5.3 X-ray inspection system software.- 5.3.1 Software for X-ray tube parameter control.- 5.3.2 Software for manipulator control.- 5.3.3 Software for image enhancement.- 5.3.4 Software for image evaluation.- 5.3.4.1 Evaluation of fiber distribution and orientation.- 5.3.4.2 Evaluation of the honeycomb wall distribution.- 5.4 Summary.- 5.5 Appendix: Tabulated results of conformity tests.- 6 Microfocus X-ray testing.- 6.1 Theory of microfocus system.- 6.1.1 Theory of the micro focus X-ray source.- 6.1.2 The microfocus X-ray tube.- 6.1.3 The parameters of the micro focus X-ray system.- 6.1.4 Specification of the tube parameters.- 6.1.5 Controlling of the acceleration high voltage.- 6.1.6 Controlling of the tube current (mA).- 6.1.7 Controlling the filament current.- 6.1.8 Controlling the impact load on the target.- 6.1.9 Controlling the electron beam.- 6.1.10 Activation and surveillance of the safety and vacuum control system.- 6.1.11 Resolution and focal spot size.- 6.1.12 Some theoretical considerations regarding resolution and focal spot size of micro focus X-ray tubes.- 6.1.13 Theory of application of the microfocus X-ray source.- 6.1.14 The detection of details.- 6.1.15 Theory of application of high energy micro focus X-ray source.- 6.2 The automatic non-destructive testing system description.- 6.2.1 Function and elements.- 6.2.2 System description.- 6.3 The microprocessor controlled microfocus.- 6.3.1 System description of ?P-MF.- 6.3.2 Front panels.- 6.3.2.1 Control module.- 6.3.2.2 List of functions.- 6.3.2.3 Power pack modules.- 6.3.3 Vacuum equipment.- 6.3.4 High voltage generators.- 6.3.4.1 High voltage cathode generator.- 6.3.4.2 High voltage anode generator.- 6.3.4.3 Anodes.- 6.3.4.4 Interconnecting cables.- 6.4 Operation.- 6.4.1 General instructions.- 6.4.2 Exposure menu.- 6.4.3 Exposure control.- 6.4.4 Start-up.- 6.4.5 Electronics of microprocessor control of microfocus unit.- 6.5 Technical description of the manipulator.- 6.5.1 The manipulator in general.- 6.6 Test of the system.- 6.7 Conclusion.- 7 Conclusions and future prospects.