Applied Measurement With Jmetrik by J. Patrick MeyerApplied Measurement With Jmetrik by J. Patrick Meyer

Applied Measurement With Jmetrik

byJ. Patrick MeyerEditorJ. Patrick Meyer

Hardcover | June 27, 2014

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jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner.Applied Measurement with jMetrikreviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

J. Patrick Meyeris an associate professor in the Curry School of Education at the University of Virginia
Title:Applied Measurement With JmetrikFormat:HardcoverDimensions:149 pages, 9.41 × 7.24 × 0.98 inPublished:June 27, 2014Publisher:Taylor and FrancisLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0415531950

ISBN - 13:9780415531955

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Table of Contents

Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5: Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating. References. Appendix