Applied Scanning Probe Methods IV: Industrial Applications by Bharat BhushanApplied Scanning Probe Methods IV: Industrial Applications by Bharat Bhushan

Applied Scanning Probe Methods IV: Industrial Applications

byBharat BhushanEditorHarald Fuchs

Paperback | February 12, 2010

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HFM, the cantilever is driven at the resonantfrequencywiththeamplitudeadjustedsothatthetipimpactsthesampleon each cycle. Theforcesbetween tipandsample generate multiple harmonics inthe motionofthecantilever.Thestrengthoftheseharmonicscanbeusedtocharacterize thephysicalpropertiesofthesurface.
Title:Applied Scanning Probe Methods IV: Industrial ApplicationsFormat:PaperbackDimensions:284 pagesPublished:February 12, 2010Publisher:Springer-Verlag/Sci-Tech/TradeLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:364206597X

ISBN - 13:9783642065972


Table of Contents

Scanning Probe Lithography for Chemical, Biological and Engineering Applications.- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM).- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography.- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography.- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM).- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection.- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices.- Applications of Heated Atomic Force Microscope Cantilevers.

Editorial Reviews

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"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. . As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)