Atom Probe Field Ion Microscopy by M. K. MillerAtom Probe Field Ion Microscopy by M. K. Miller

Atom Probe Field Ion Microscopy

byM. K. Miller, A. Cerezo, M. G. Hetherington

Hardcover | January 1, 1996

Pricing and Purchase Info


Earn 2,288 plum® points

Prices and offers may vary in store


Ships within 1-3 weeks

Ships free on orders over $25

Not available in stores


This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely dueto the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-theart account of this important field, and is intended for a graduate-level readership.
Hetherington - deceased
Title:Atom Probe Field Ion MicroscopyFormat:HardcoverDimensions:520 pages, 9.21 × 6.14 × 1.3 inPublished:January 1, 1996Publisher:Oxford University Press

The following ISBNs are associated with this title:

ISBN - 10:0198513879

ISBN - 13:9780198513872

Look for similar items by category:


Table of Contents

1. Historical background and general introduction2. Physical principles of field ion microscopy3. FIM image interpretation and application4. Physical principles of atom probe interpretation5. Statistical analysis of atom probe data6. Metallurgical applications7. Atom probe studies of non-metallic materials, thin films and surface phenomenaEpilogue: future directions

Editorial Reviews

`For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields.'Aslib Book Guide, vol.61, no.12, December 1996.