Atom Probe Field Ion Microscopy by M. K. Miller

Atom Probe Field Ion Microscopy

byM. K. Miller, A. Cerezo, M. G. Hetherington

Hardcover | January 1, 1996

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This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely dueto the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-theart account of this important field, and is intended for a graduate-level readership.

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Hetherington - deceased
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Details & Specs

Title:Atom Probe Field Ion MicroscopyFormat:HardcoverDimensions:520 pages, 9.21 × 6.14 × 1.3 inPublished:January 1, 1996Publisher:Oxford University Press

The following ISBNs are associated with this title:

ISBN - 10:0198513879

ISBN - 13:9780198513872

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Table of Contents

1. Historical background and general introduction2. Physical principles of field ion microscopy3. FIM image interpretation and application4. Physical principles of atom probe interpretation5. Statistical analysis of atom probe data6. Metallurgical applications7. Atom probe studies of non-metallic materials, thin films and surface phenomenaEpilogue: future directions

Editorial Reviews

`For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields.'Aslib Book Guide, vol.61, no.12, December 1996.