Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Hardcover | December 31, 1999

EditorSamuel H. Cohen

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This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

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This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written ...

Format:HardcoverDimensions:218 pages, 9.41 × 7.24 × 0.98 inPublished:December 31, 1999Publisher:SpringerLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0306462974

ISBN - 13:9780306462979

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Table of Contents

Preface. Keynote Paper: A Practical Approach to Understanding Surface Metrology and Its Applications; C.A. Brown. Applications of Scanning Probe Microscopy in Materials Science: Examples of Surface Modification and Quantitative Analysis; P. von Blanckenhagen. Scanning Probe Microscopy in Biology with Potential Applications in Forensics; J. Vesenka, E. Morales. Atomic Manipulation of Hydrogen on Hydrogen-Terminated Silicon Surfaces with Scanning Tunneling Microscope; D.H. Huang, Y. Yamamoto. Apollo 11 Lunar Samples: An Examination Using Tapping Mode Atomic Force Microscopy and Other Microscopic Methods; E.C. Hammond, et al. Novel Micromachined Cantilever Sensors for Scanning Near-Field Microscopy; W. Scholz, et al. Imaging of Cell Surface Structure by Scanning Probe Microscopy; V.A. Fedirko, et al. A Force Limitation for Successful Observation of Atomic Defects: Defect Trapping of the Atomic Force Microscopy Tip; I.Y. Sokolov, et al. A New Approach To Examine Interfacial Interaction Potential Between a Thin Solid Film or a Droplet and a Smooth Substrate; R. Mu, et al. Nanometer-Scale Patterning of Surfaces Using Self-Assembly Chemistry. 1. Preliminary Studies of Polyaniline Electrodeposition on Self-Assembled Mixed Monolayers; W.A. Hayes, C. Shannon. Local Rate of Electroless Copper Deposition by Scanning Tunneling Microscopy; C.J. Weber, et al. Atomic Force Microscopy of Olivine; C. Wilson, et al. The Study of Sublimation Rates and Nucleation and Growth of TNT and PETN on Silica and Graphite Surfaces by Optical and Atomic Force Microscopy and Ellipsometry; Y.S. Tung, et al. Peculiarities of the Scanning Tunneling Microscopy Probe on Porous Gallium Phosphide; V.M. Ichizli, et al. Influence of Doping Concentration on The Etching Rate of GaAs Studied by Atomic Force Microscopy; R.S. Freitas, et al. Comparative Scanning Tunneling Microscopy Studies of CoFe2O4 Nanoparticles of Ferrofluids in Acidic Medium; D. Dai, et al. From Laboratory Measurements to the First In-Situ Analysis of Pristine Cometary Grains; J. Romstedt, et al. Synthesis of Prebiotic Peptides and Oligonucleotides on Clay Mineral Surfaces: A Scanning Force Microscopy Study; T.L. Porter, et al. Surface Structure and Intercalative Polymerization Studies of Smectite Clay Thin Films; T.L. Porter, et al. Atomic Force Microscopy &endash; A New and Complementary Tool in Asphalt Research Compared to Scanning Electron Microscopy; L. Loeber, et al. Index.