Atomic Force Microscopy by Peter EatonAtomic Force Microscopy by Peter Eaton

Atomic Force Microscopy

byPeter Eaton, Paul West

Hardcover | April 11, 2010

Pricing and Purchase Info


Earn 605 plum® points

Prices and offers may vary in store


Ships within 1-3 weeks

Ships free on orders over $25

Not available in stores


Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurementsof magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design,construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industryillustrate the different capabilities of the technique.
Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of...
Title:Atomic Force MicroscopyFormat:HardcoverDimensions:288 pagesPublished:April 11, 2010Publisher:Oxford University PressLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0199570450

ISBN - 13:9780199570454

Look for similar items by category:


Table of Contents

1. Introduction2. Instrumental Aspects of AFM3. AFM Modes4. Measuring AFM Images5. Image Processing in AFM6. Image Artifacts in AFM7. Applications of AFMAppendix 1: AFM Standards and Calibration SpecimensAppendix 2: AFM Software

Editorial Reviews

"There is definitely room for a general book on AFM which concentrates on how to get the most from the instrument and teaches the beginner/moderately experienced user the 'tricks of the trade'." --Jamie Hobbs, Sheffield University, UK