Calibration Techniques in Nyquist A/D Converters by Hendrik van der PloegCalibration Techniques in Nyquist A/D Converters by Hendrik van der Ploeg

Calibration Techniques in Nyquist A/D Converters

byHendrik van der Ploeg

Paperback | November 25, 2010

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In modern systems signal processing is performed in the digital domain. Contrary to analog circuits, digital signal processing offers more robustness, programmability, error correction and storage possibility. The trend to shift the A/D converter towards the input of the system requires A/D converters with more dynamic range and higher sampling speeds. This puts extreme demands on the A/D converter and potentially increases the power consumption.Calibration Techniques in Nyquist A/D Converters analyses different A/D-converter architectures with an emphasis on the maximum achievable power efficiency. It is shown that in order to achieve high speed and high accuracy at high power efficiency, calibration is required. Calibration reduces the overall power consumption by using the available digital processing capability to relax the demands on critical power hungry analog components. Several calibration techniques are analyzed. The calibration techniques presented in this book are applicable to other analog-to-digital systems, such as those applied in integrated receivers. Further refinements will allow using analog components with less accuracy, which will then be compensated by digital signal processing. The presented methods allow implementing this without introducing a speed or power penalty.
Title:Calibration Techniques in Nyquist A/D ConvertersFormat:PaperbackDimensions:208 pages, 9.45 × 6.3 × 0.03 inPublished:November 25, 2010Publisher:Springer NetherlandsLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:9048171598

ISBN - 13:9789048171590

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Table of Contents

List of abbreviations. List of symbols. Preface. 1. Introduction. 1.1 A/D conversion systems. 1.2 Motivation and objectives. 1.3 Layout of the book.2. Accuracy, speed and power relation. 2.1 Introduction. 2.2 IC-technology accuracy limitations. 2.3 Speed and power. 2.4 Maximum speed. 2.5 CMOS Technology Trends. 2.6 Conclusions.3. A/D converter architecture comparison. 3.1 Introduction. 3.2 Flash. 3.3 Folding and interpolation. 3.4 Two-step. 3.5 Pipe-line. 3.6 Successive approximation. 3.7 Theoretical power consumption comparison. 3.8 Conclusions.4. Enhancement techniques for two-step A/D converters. 4.1 Introduction. 4.2 Error sources in a two-step A/D architecture. 4.3 Residue gain in two-step A/D converters. 4.4 Offset calibration. 4.5 Mixed-signal chopping and calibration.5. A 10-bit two-step ADC with analog online calibration. 5.1 Introduction. 5.2 Two-step architecture. 5.3 Circuit design. 5.4 Experimental results. 5.5 Discussion. 5.6 Conclusions.6. A 12-bit two-step ADC with mixed-signal chopping and calibration. 6.1 Introduction. 6.2 Two-step architecture. 6.3 Mixed-signal chopping and calibration. 6.4 Circuit design. 6.5 Experimental results. 6.6 Discussion. 6.7 Conclusions.7. A low-power 16-bit three-step ADC for imaging applications. 7.1 Introduction. 7.2 Three-step architecture. 7.3 Noise considerations. 7.4 Mixed-signal chopping and calibration. 7.5 Supply voltages. 7.6 Experimental results. 7.7 Discussion. 7.8 Conclusions.8. Conclusions. A. Static and dynamic accuracy requirements. References. Index.