Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale by R. RoseiChemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale by R. Rosei

Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale

byR. Rosei

Paperback | October 15, 2012

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An assessment of the recent achievements and relative strengths of two developing techniques for characterising surfaces at the nanometer scale: (i) local probe methods, including scanning tunnelling microscopy and its derivatives; and (ii) nanoscale photoemission and absorption spectroscopy for chemical analysis.
The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolvedin situreaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.
Title:Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer ScaleFormat:PaperbackDimensions:132 pages, 24 × 16 × 0.17 inPublished:October 15, 2012Publisher:Springer-Verlag/Sci-Tech/TradeLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:9401064148

ISBN - 13:9789401064149

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Table of Contents

Preface. Surface State Electrons: Transport through Dangling Bonds on Silicon, and Scattering and Confinement on Metals; P. Avouris, et al. SFFM and SNOM of Heterogeneous Materials; O. Marti, et al. Synchrotron Radiation Spectromicroscopy: Opportunities, Limitations and Data Taking Strategies; G. Margaritondo. Scanning Spectro-Microscopy with 250 to 800 eV X-Rays; H. Ade, C-H Ko. Recent Advances in LEEM/PEEM for Structural and Chemical Analysis; E. Bauer, et al. Spectromicroscopy: Some Developments at BESSY; R. Fink, et al. Shedding Light on Surface Reactions PEEM, EMSI and RAM Probed Chemistry on Solid Surfaces; H.H. Rotermund. Subject Index.