CMOS Digital Integrated Circuits Analysis & Design by Sung-Mo (Steve) KangCMOS Digital Integrated Circuits Analysis & Design by Sung-Mo (Steve) Kang

CMOS Digital Integrated Circuits Analysis & Design

bySung-Mo (Steve) Kang, Yusuf Leblebici, Chul Woo Kim

Hardcover | January 24, 2014

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The fourth edition of CMOS Digital Integrated Circuits: Analysis and Design continues the well-established tradition of the earlier editions by offering the most comprehensive coverage of digital CMOS circuit design, as well as addressing state-of-the-art technology issues highlighted by the widespread use of nanometer-scale CMOS technologies. In this latest edition, virtually all chapters have been re-written, the transistor model equations and device parameters have been revised to reflect the sigificant changes that must be taken into account for new technology generations, and the material has been reinforced with up-to-date examples.

The broad-ranging coverage of this textbook starts with the fundamentals of CMOS process technology, and continues with MOS transistor models, basic CMOS gates, interconnect effects, dynamic circuits, memory circuits, arithmetic building blocks, clock and I/O circuits, low power design techniques, design for manufacturability and design for testability.

Title:CMOS Digital Integrated Circuits Analysis & DesignFormat:HardcoverDimensions:9.4 × 7.5 × 1.7 inPublished:January 24, 2014Publisher:McGraw-Hill EducationLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0073380628

ISBN - 13:9780073380629

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Table of Contents

1) Introduction

2) Fabrication of MOSFETS

3) MOS Transistor

4) Modeling of MOS Transistors Using SPICE

5) MOS Inverters: Static Characteristics

6) MOS Inverters: Switching Characteristics and Interconnect Effects

7) Combinational MOS Logic Circuits

8) Sequential MOS Logic Circuits

9) Dynamic Logic Circuits

10) Semiconductor Memories

11) Low-Power CMOS Logic Circuits

12) Arithmetic Building Blocks

13) Chip Input and Output (I/O) Circuits

14) Design for Manufacturability

15) Design for Testability