Defect and Microstructure Analysis by Diffraction by Robert SnyderDefect and Microstructure Analysis by Diffraction by Robert Snyder

Defect and Microstructure Analysis by Diffraction

EditorRobert Snyder, Jaroslav Fiala, Hans J Bunge

Hardcover | January 6, 2000

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Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Robert Snyder is in the Department of Materials Science and Engineering, Columbus. Jaroslav Fiala is at Central Research Institute Skoda. Hans Bunge is at the Institut fur Metallkunde und Metallphysik de TU.
Title:Defect and Microstructure Analysis by DiffractionFormat:HardcoverPublished:January 6, 2000Publisher:Oxford University PressLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0198501897

ISBN - 13:9780198501893

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Table of Contents

Fiala and Snyder: Introduction to Defect and Microstructure Analysis or the Analysis of Real-StructureBradaczek: Some Applications of the Kinematical Theory of X-ray DiffractionEnzo and Schiffini: Profile Fitting and Analytical FunctionsHonkimaki and Suortti: Effects of Instrument Function, Crystallite Size, and Strain on Reflection ProfilesLangford: Use of Pattern Decomposition or Simulation to Study Microstructure: theoretical considerationsHouska and Kuzel: Classical Treatment of Line Profiles Influenced by Strain, Small Size, and Stacking FaultsBalzar: Voigt-Function Model in Diffraction Line-Broadening AnalysisBarabash: X-Ray Analysis of Precipitation Related Crystals with Dislocation SubstructureUngar: The Dislocation Based Model of Strain Broadening in X-Ray Line-Profile AnalysisVermeulen et al: Diffraction-Line Broadening Analysis of Dislocation ConfigurationsBerkum et al: Diffraction-Line Broadening Analysis of Strain Fields in Crystalline SolidsBradaczek: ParacrystallinityWilke: The Model of the Paracrystal and its Application to PolymersUstinov: Effect of Planar Defects in Crystal on the Position and Profile of Powder Diffraction LineWeiss and Capkova: Effect of Stacking Disorder on the Profile of the Powder Diffraction LineSmith: Crystallite Statistics and Accuracy in Powder Diffraction Intensity MeasurementsFewster and Andrew: Reciprocal Space Mapping and Ultra-High Resolution Diffraction of Polycrystalline MaterialsGanev: X-Ray Analysis of The Inhomogeneous Stress StateBunge: Texture AnalysisValvoda: Texture Effects in Powder Diffraction and their Correction by Simple Empirical FunctionsLe Bail: Accounting For Size and Microstrain in Whole Powder Pattern FittingJarvinen: Modelling of Texture in Whole Pattern FittingScardi: A New Whole Powder Pattern Fitting ApproachSmith: The Role of Whole-Pattern Databases in Materials ScienceCernansky: Restoration and Preprocessing of Physical Profiles from Measured DataReefman: Towards Higher Resolution: A Mathematical ApproachLouer: Use of Pattern Decomposition to Study Microstructure: Practical Aspects and ApplicationsKimmel and Dayan: X-Ray Diffraction Broadening Effects in Materials CharacterizationSomashekar: Crystal Size and Distortion Parameters in Fibres using WAXSYamanaka: Pressure Induced Profile Change of Energy Dispersive Diffraction

Editorial Reviews

'This book reviews the state of the art for determining the "real" structure of matter' Zeitschrift Fur kristallographie