Design, Analysis and Test of Logic Circuits Under Uncertainty by Smita KrishnaswamyDesign, Analysis and Test of Logic Circuits Under Uncertainty by Smita Krishnaswamy

Design, Analysis and Test of Logic Circuits Under Uncertainty

bySmita Krishnaswamy, Igor L. Markov, John P. Hayes

Paperback | October 15, 2014

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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Title:Design, Analysis and Test of Logic Circuits Under UncertaintyFormat:PaperbackDimensions:124 pages, 23.5 × 15.5 × 0.17 inPublished:October 15, 2014Publisher:Springer-Verlag/Sci-Tech/TradeLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:9400797982

ISBN - 13:9789400797987

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Table of Contents

Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.