Efficient Test Methodologies for High-Speed Serial Links

March 1, 2012|
Efficient Test Methodologies for High-Speed Serial Links by Dongwoo Hong
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Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

Title:Efficient Test Methodologies for High-Speed Serial LinksFormat:PaperbackProduct dimensions:98 pages, 9.25 X 6.1 X 0 inShipping dimensions:98 pages, 9.25 X 6.1 X 0 inPublished:March 1, 2012Publisher:Springer-Verlag/Sci-Tech/TradeLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:9400730942

ISBN - 13:9789400730946

Appropriate for ages: All ages

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