Electromigration and Electronic Device Degradation by Aris ChristouElectromigration and Electronic Device Degradation by Aris Christou

Electromigration and Electronic Device Degradation

EditorAris Christou, Aristos Christou

Hardcover | December 29, 1993

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Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
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Title:Electromigration and Electronic Device DegradationFormat:HardcoverDimensions:343 pages, 9.45 × 6.3 × 0.79 inPublished:December 29, 1993Publisher:Wiley

The following ISBNs are associated with this title:

ISBN - 10:0471584894

ISBN - 13:9780471584896

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Table of Contents

Reliability and Electromigration Degradation of GaAs Microwave Monolithic Integrated Circuits (A. Christou).

Simulation and Computer Models for Electromigration (P. Tang).

Temperature Dependencies on Electromigration (M. Pecht & P. Lall).

Electromigration and Related Failure Mechanisms in VLSI Metallizations (A. Christou & M. Peckerar).

Metallic Electromigration Phenomena (S. Krumbein).

Theoretical and Experimental Study of Electromigration (J. Zhao).

GaAs on Silicon Performance and Reliability (P. Panayotatos, et al.).

Electromigration and Stability of Multilayer Metal-Semiconductor Systems on GaAs (A. Christou).

Electrothermomigration Theory and Experiments in Aluminum Thin Film Metallizations (A. Christou).

Reliable Metallization for VLSI (M. Peckerar).

Index.