Formerly Advances in Electronics and Electron Physics

Other | July 1, 1995

byHawkes, Peter W., Peter W. Hawkes

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Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Continuation order customers for either of the original Advances will receiveVolume 90, the first combined volume.

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Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on...

Format:OtherDimensions:338 pages, 1 × 1 × 1 inPublished:July 1, 1995Publisher:Academic PressLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0080577598

ISBN - 13:9780080577593

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Table of Contents

R. Tolimieri, M. An, Y. Abdelatif, C. Lu, G. Kechriotis, and N. Anupindi,Group Invariant Fourier Transform Algorithms.J.T. Fourie,Crystal-Aperture STEM.N. Nakajima,Phase Retrieval Using the Properties ofEntire Functions.G. Pozzi,Multislice Approach to Lens Analysis.N.K. Tovey, M.W. Hounslow, and J. Wang,Orientation Analysis and Its Applications in Image Analysis. Reference. Subject Index.