Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition

Paperback | November 26, 2008

byVitalij Pecharsky

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This new edition provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though fifteen give essential theoretical background, while chapters sixteen through twenty-five guide the reader through practical aspects of extracting structural information from powder data. Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition is suited for undergraduate and graduate students and practitioners from materials science, solid-state chemistry, physics, geology, and literally any other science or engineering background, who demand structural information at the atomic resolution using the powder diffraction method.  Key features of the second edition: The book requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method.While developed as a text to teach students, the book is also a reference for academic and industrial researchers using the powder diffraction method in their daily work.Major revisions includeexpanded treatment of non-crystallographic symmetrybrief introductions to the total scattering analysis and non-ambient powder diffractometrybasics of quantitative analysis using the Rietveld method, including determination of amorphous contentaddition of a difficult pseudo-symmetric indexing caseexpanded coverage of direct space structure solution techniquesan introduction to the mechanism of constraints, restraints and rigid bodies and a new example of structure solution of a pharmaceutical compoundadditional problems to help in assessment of students' progress. The book is supplemented by online content, including color figures, powder diffraction data, examples, and web links.

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From the Publisher

This new edition provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental ...

From the Jacket

This new edition provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental ...

Format:PaperbackDimensions:768 pages, 9.25 × 6.1 × 0 inPublished:November 26, 2008Publisher:SpringerLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0387095780

ISBN - 13:9780387095783

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Table of Contents

Fundamentals of Crystalline State.- Fundamentals of Diffraction.- Experimental Techniques.- Preliminary Data Processing and Phase Analysis.- Unit Cell Determination and Refinement.- Crystal Structure Determination.- Crystal Structure Refinement.

Editorial Reviews

From a review of the first edition:"The book is well written and organized. The authors' enthusiasm and dedication to the subject matter are clearly evident. I find the book to be not only an excellent introduction to structural characterization, but also a valuable introduction to the world of the working crystallographer. The text is rich in references to internet resources, software, literature, organizations, databases, and institutions that x-ray researchers employ routinely. As a class text the book could be used in an introductory course for third or fourth year undergraduates in materials science, chemistry, physics, or geochemistry. The detailed structural treatments may be too much for the typical introductory x-ray diffraction course, but students would be adding a valuable text for future reference to their libraries. The sections are also ideal for more advanced coursework at the graduate level. Beyond the classroom, any researcher desiring structural information on materials would benefit from this book." - Materials Today, July/August 2004 Amazon.com readers:http://www.amazon.com/Fundamentals-Diffraction-Structural-Characterization-Materials/dp/0387241477/ref=pd_bbs_sr_1?ie=UTF8&s=books&qid=1229536007&sr=8-1