High-Resolution Electron Microscopy by John C. H. SpenceHigh-Resolution Electron Microscopy by John C. H. Spence

High-Resolution Electron Microscopy

byJohn C. H. Spence

Paperback | May 13, 2017

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This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, andmultiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have beenupdated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, anddetectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction,environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.
John C. H. Spence is Regent's Professor of Physics at Arizona State University with a joint appointment at Lawrence Berkeley Laboratory. He completed a PhD in Physics at Melbourne University in Australia, followed by postdoctoral work in Materials Science at Oxford University, UK. He is a Fellow of the American Physical Society, of the...
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Title:High-Resolution Electron MicroscopyFormat:PaperbackDimensions:432 pages, 9.69 × 6.73 × 0.03 inPublished:May 13, 2017Publisher:Oxford University PressLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0198795831

ISBN - 13:9780198795834

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Table of Contents

1. Preliminaries2. Electron Optics3. Wave Optics4. Coherence and Fourier Optics5. Imaging Thin Crystals and their Defects6. Imaging Molecules: Radiation Damage7. Image Processing, Super-Resolution, Diffractive Imaging8. STEM and Z-contrast9. Electron Sources and Detectors10. Measurement of Electron-Optical Parameters11. Instabilities and the Microscope Environment12. Experimental Methods13. Associated Techniques and Software ResourcesAppendices

Editorial Reviews

"... essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest developments in electron detection technology and analytical microscopic techniques." --Jian-Min Zuo, Microscopy and Microanalysis