Images of Materials by David B. WilliamsImages of Materials by David B. Williams

Images of Materials

EditorDavid B. Williams, Alan R. Pelton, Ronald Gronsky

Hardcover | April 30, 1999

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This spectacularly illustrated book celebrates the structural beauty of everyday materials and the space-age technologies used to probe their surface features and internal structures. It introduces the reader to the various instruments and their uses: scanning electron, ion, and tunnelingmicroscopies, acoustic microscopy and transmission electron microscopy. The book describes how images are processed and analyzed, and how modern materials science is based on these techniques and their ability to "see" materials at the atomic level. The book includes hundreds of illustrations and 32pages of beautiful color plates depicting the complex microscopic realm within such everyday materials as the metals used in cars and planes, polymer fabrics, ceramics, and the ubiquitous silicon semiconductors, without which society today would fall into disarray and confusion. The many full-colorand black-and-white illustrations make this book a pleasure for the eye, in addition to being a useful resource for scientists, students, researchers, and engineers involved in solid-state physics, materials science, geology, and chemistry.
David B. Williams is at Lehigh University. Alan R. Pelton is at Raychem Corporation.
Title:Images of MaterialsFormat:HardcoverDimensions:432 pagesPublished:April 30, 1999Publisher:Oxford University Press

The following ISBNs are associated with this title:

ISBN - 10:0195058569

ISBN - 13:9780195058567

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Table of Contents

1. G.F. Vander Voort: Imaging by Light Optical Microscopy2. D.C. Joy and J.I. Goldstein: Scanning Electron Microscopy3. R. Levi-Setti, et al.: Analytical Imaging With A Scanning Ion Microprobe4. G.A.D. Briggs and M. Hoppe: Acoustic Microscopy5. G. Thomas: Transmission Electron Microscopy6. D.B. Williams and K.S. Vecchio: Electron Diffraction Images7. R. Gronsky: Atomic Resolution Microscopy8. S. Chiang and R.J. Wilson: Surface Imaging by Scanning Tunneling Microscopy9. M.K. Miller and M.G. Burke: Atom Probe Field-Ion Microscopy: Imaging at the Atomic Level10. D.E. Newbury, et al.: Compositional Mapping of the Microstructure of Materials11. D.S. Bright, et al.: Processing Images and Selecting Regions of Interest12. J.C. Russ: Image Analysis of the Microstructure of Materials

Editorial Reviews

"Good concise descriptions, written by people who know their stuff. You will find a lot of pictures, many of them very informative and taken with a great deal of skill. You will most probably find something to interest you -- I did. The subject matter of this book is thus of great importance."--Peter Goodhew, Materials and Design