Materials Science And Engineering Of Carbon: Characterization by Michio InagakiMaterials Science And Engineering Of Carbon: Characterization by Michio Inagaki

Materials Science And Engineering Of Carbon: Characterization

byMichio InagakiEditorFeiyu Kang

Hardcover | June 9, 2016

Pricing and Purchase Info

$191.54 online 
$199.50 list price
Earn 958 plum® points

Prices and offers may vary in store


In stock online

Ships free on orders over $25

Not available in stores


Materials Science and Engineering of Carbon: Characterizationdiscusses 12 characterization techniques, focusing on their application to carbon materials, including X-ray diffraction, X-ray small-angle scattering, transmission electron microscopy, Raman spectroscopy, scanning electron microscopy, image analysis, X-ray photoelectron spectroscopy, magnetoresistance, electrochemical performance, pore structure analysis, thermal analyses, and quantification of functional groups.

Each contributor in the book has worked on carbon materials for many years, and their background and experience will provide guidance on the development and research of carbon materials and their further applications.

  • Focuses on characterization techniques for carbon materials
  • Authored by experts who are considered specialists in their respective techniques
  • Presents practical results on various carbon materials, including fault results, which will help readers understand the optimum conditions for the characterization of carbon materials
Michio Inagaki is a famous carbon material scientist, who obtained his PhD degree from Nagoya University in 1963. He has worked on carbon materials for more than 50 years. In 2011, he won the Peter A. Thrower Award for Exceptional Contribution to the International Carbon Community.Feiyu Kang received his PhD from The Hong Kong Universi...
Title:Materials Science And Engineering Of Carbon: CharacterizationFormat:HardcoverDimensions:338 pages, 9.41 × 7.24 × 0.98 inPublished:June 9, 2016Publisher:Butterworth (trade)Language:English

The following ISBNs are associated with this title:

ISBN - 10:0128052562

ISBN - 13:9780128052563

Look for similar items by category:


Table of Contents

  1. Introduction
  2. X-ray Diffraction
  3. Small-Angle X-ray Scattering
  4. Transmission Electron Microscopy
  5. Scanning Electron Microscopy
  6. Image analysis
  7. Raman Spectroscopy
  8. X-ray Photoelectron Spectroscopy
  9. Magnetoresistance
  10. Electrochemical Performance
  11. Gas Adsorption/Desorption for Pore Structure Characterization
  12. Thermal Analysis
  13. Titration Method for the Identification of Surface Functional Groups
  14. Temperature Programmed Desorption