Microanalysis of Solids

Hardcover

EditorB.G. Yacobi

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This book systematically describes the most widely used techniques for the microanalysis of the physical, structural, and compositional properties of solids. Covering electron beams, ion beams, photon beams, and acoustic waves, it will provide physicists, materials scientists, electrical engineers, chemists, and their students with a comprehensive reference source.

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This book systematically describes the most widely used techniques for the microanalysis of the physical, structural, and compositional properties of solids. Covering electron beams, ion beams, photon beams, and acoustic waves, it will provide physicists, materials scientists, electrical engineers, chemists, and their students ...

Format:HardcoverDimensions:473 pages, 9.25 × 6.1 × 0.39 inPublisher:Springer US

The following ISBNs are associated with this title:

ISBN - 10:030644433X

ISBN - 13:9780306444333

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Table of Contents

An Introduction to Microanalysis of Solids; B.G. Yacobi, D.B. Holt. Scanning Electron Microscopy; B.G. Yacobi, D.B. Holt. Transmission Electron Microscopy; A.J. Garratt-Reed. Augur Electron Spectroscopy; L.L. Kazmerski. Secondary Ion Mass Spectrometry; S.E. Asher. Applications of MeV Ion Beams in Materials Analysis; P. Revesz, J. Li. Confocal Microscopy; T. Wilson. XRay Microscopy; A.G. Michette, A.C. Potts. XRay Photoemission Spectroscopy; A. Nelson. Laser Ionization Mass Spectrometry; R.W. Odom, F. Radicati di Brozolo. Microellipsometry; R.F. Cohn. Scanning Acoustic Microscopy; P. Mutti, G.A.D. Briggs. Field Emission, Field Ion Microscopy, and the Atom Probe; J.J. Hren, J. Liu. Scanning Probe Microscopy; D.A. Grigg, P.E. Russell. Index.