Nanoscale CMOS VLSI Circuits: Design for Manufacturability: Design For Manufacturability by Sandip Kundu

Nanoscale CMOS VLSI Circuits: Design for Manufacturability: Design For Manufacturability

bySandip Kundu, Aswin Sreedhar

Hardcover | July 8, 2010

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Cutting-Edge CMOS VLSI Design for Manufacturability Techniques

This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource.

Nanoscale CMOS VLSI Circuits covers:

  • Current trends in CMOS VLSI design
  • Semiconductor manufacturing technologies
  • Photolithography
  • Process and device variability: analyses and modeling
  • Manufacturing-Aware Physical Design Closure
  • Metrology, manufacturing defects, and defect extraction
  • Defect impact modeling and yield improvement techniques
  • Physical design and reliability
  • DFM tools and methodologies

About The Author

Dr. Sandip Kundu is a professor in the Electrical and Computer Engineering Department at the University of Massachusetts at Amherst, specializing in semiconductor and lithographic manufacturing.Dr. Aswin Sreedhar is a research assistant at the Electrical and Computer Engineering Department at the University of Massachusetts.
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Details & Specs

Title:Nanoscale CMOS VLSI Circuits: Design for Manufacturability: Design For ManufacturabilityFormat:HardcoverDimensions:316 pages, 9.3 × 6.3 × 0.98 inPublished:July 8, 2010Publisher:McGraw-Hill EducationLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:007163519X

ISBN - 13:9780071635196

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Table of Contents

Chapter 1. Introduction; Chapter 2. Semiconductor Manufacturing; Chapter 3. Process and Device Variability: Analysis and Modeling; Chapter 4. Manufacturing-Aware Physical Design Closure; Chapter 5. Metrology, Manufacturing Defects, and Defect Extraction; Chapter 6. Defect Impact Modeling and Yield Improvement Techniques; Chapter 7. Physical Design and Reliability; Chapter 8. Design for Manufacturability: Tools and Methodologies