Noncontact Atomic Force Microscopy: Volume 3 by Seizo MoritaNoncontact Atomic Force Microscopy: Volume 3 by Seizo Morita

Noncontact Atomic Force Microscopy: Volume 3

bySeizo MoritaEditorFranz J. Giessibl, Ernst Meyer

Hardcover | June 2, 2015

Pricing and Purchase Info

$205.29 online 
$248.50 list price save 17%
Earn 1,026 plum® points

Prices and offers may vary in store

Quantity:

In stock online

Ships free on orders over $25

Not available in stores

about

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Title:Noncontact Atomic Force Microscopy: Volume 3Format:HardcoverDimensions:527 pagesPublished:June 2, 2015Publisher:Springer-Verlag/Sci-Tech/TradeLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:3319155873

ISBN - 13:9783319155876

Look for similar items by category:

Reviews

Table of Contents

Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.- Revealing Subsurface Vibrational Modes by Atom-Resolved Damping Force Spectroscopy.- Interaction and Self-Assembly of Organic Molecules on Insulating Surfaces.- NC-AFM Experiments on Molecular Systems.- Single-Molecule Force Spectroscopy.- Submolecular Resolution and Tip Functionalization.- Mapping the Force-Fields of Intra- and Intermolecular Bonds.- Single-Molecule Force-Sensor Assisted Scanning Tunneling Microscopy.- Nanostructured Surfaces of Doped Alkali Halides.- The Atomic Structure of Two-Dimensional Silica.- NC-AFM Imaging of Molecules at Surfaces of Bulk Insulators.- Simulating NC-AFM of Complex Systems.- Recent Progress in Frequency Modulation Atomic Force Microscopy in Liquids.- Subnanometer-Resolution FM-AFM Imaging at Solid/Liquid Interfaces.- High Spatial-Resolution AFM Studies of Electrochemical Interfaces.- High-Speed Atomic Force Microscopic Observation of Motor Proteins.