Particle-Induced X-Ray Emission Spectrometry (PIXE) by Sven A. E. JohanssonParticle-Induced X-Ray Emission Spectrometry (PIXE) by Sven A. E. Johansson

Particle-Induced X-Ray Emission Spectrometry (PIXE)

EditorSven A. E. Johansson, John L. Campbell, Klas G. Malmqvist

Hardcover | August 18, 1995

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The authoritative handbook to exploiting the full power and versatility of PIXE— now and in the next century

Respected for its practical accuracy and detection range of parts per million, particle-induced X-ray emission has enjoyed a secure place in the analytical arsenal of the nuclear physics laboratory. Yet, its undeniable analytical potential in other areas of science has scarcely been tapped. This unique reference, from PIXE specialists in biomedicine, atmospheric science, earth science, and art and archaeology, features a user-based look at PIXE's conceptual basics and methodology, with a view toward new and creative analytical work.

Touching on every facet of PIXE technology, from basic instrumentation, specimens, the characteristics of X-ray spectroscopy, standardization of quantitative analysis, to the accuracy of PIXE analysis and its limits of detection, the book offers an unprecedented look at the newer uses of PIXE in such areas as:

  • Applications of macro- and micro-PIXE in medicine, zoology, and botany
  • Analysis of atmospheric aerosols
  • Geological and extra-terrestrial material
  • Analysis of gem stones, pottery, glass, and alloys
  • As an exploratory tool for pigments and paintings and "paper-like" materials

Complete with a comparative look contrasting PIXE with more conventional forms of analysis, this important reference is key to grasping the technique's practical specifics and exploiting its full analytical potential.

SVEN A. E. JOHANSSON received his PhD from the University of Lund in 1952. He held appointments at the National Atomic Commission, Chalmers University, and the Lund Institute of Technology. At Lund, Dr. Johansson occupied the Chair of Nuclear Physics and served as both Director of LIT and Vice Chancellor of the University of Lund. He w...
Title:Particle-Induced X-Ray Emission Spectrometry (PIXE)Format:HardcoverDimensions:451 pages, 9.33 × 6.38 × 1.06 inPublished:August 18, 1995Publisher:Wiley

The following ISBNs are associated with this title:

ISBN - 10:0471589446

ISBN - 13:9780471589440

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Table of Contents

Instrumentation, Fundamentals, and Quantification (J. Campbell).

The High-Energy Ion Microprobe (F. Watt & G. Grime).

Biological and Medical Applications (K. Malmqvist).

Compositional Analysis of Atmospheric Aerosols (T. Cahill).

Applications in Earth Sciences (J. Campbell).

Applications in Art and Archaeology (K. Malmqvist).

Comparison with Other Methods: Future Prospects (S. Johansson & J. Campbell).



From Our Editors

Long proven as an analytical tool of uncommon accuracy and utility, particle-induced X-ray emission has enjoyed a solid, if narrow, reputation in the area of chemical analysis. Capable of detecting elemental concentrations down to parts per million, PIXE is now a standard component of the analytical arsenal of the nuclear physics laboratory. Yet in wider avenues of chemical research, PIXE technology is still relatively new and untested. An inside look at the nuts and bolts of PIXE from specialists who've refined the technique in biomedicine, atmospheric science, geology, and art and archaeology, this comprehensive introduction to PIXE reveals its conceptual foundation and unique methodology as well as its, as yet, enormous untapped potential as a primary analytical tool. Particle-Induced X-Ray Emission Spectrometry (PIXE) offers professionals and students a practical, user-based look at the many facets and current uses of PIXE for multielemental analysis while providing a stimulus for creative, insightful investigation. Beginning with a brief history of PIXE, the