Radiation Effects on Embedded Systems by Raoul VelazcoRadiation Effects on Embedded Systems by Raoul Velazco

Radiation Effects on Embedded Systems

EditorRaoul Velazco, Pascal Fouillat, Ricardo Reis

Paperback | October 19, 2010

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This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
Title:Radiation Effects on Embedded SystemsFormat:PaperbackDimensions:277 pages, 9.25 × 6.1 × 0.03 inPublished:October 19, 2010Publisher:Springer NetherlandsLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:9048174171

ISBN - 13:9789048174171

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Table of Contents

1- Space Radiation Environment, J.-C. Boudenot (THALES)2- Radiation Effects in Microelectronics, R. Schrimpf (Vanderbilt Univ. ) 3- In-Flight Anomalies on Electronic Devices, R. Ecoffet (CNES) 4- Multi-Level Fault Effects Evaluation, L. Anghel (TIMA), M. Rebaudengo, M. Sonza Reorda, M. Violante (POLI Torino) 5- Effects of Radiation on Analog & Mixed-Signal Circuits, M. Lubaszewski, T. Balen, E. Schuler, L.Carro (UFRGS), J.L. Huertas (IMSE-CNM)6- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing , P. Fouillat, V. Pouget (IXL), D. McMorrow (NRL). F. Darracq (IXL), S. Buchner (QSS), D. Lewis (IXL)7- Design Hardening Methodologies for ASICs , F. Faccio (CERN)8- Fault Tolerance in Programmable Circuits, F. Kastensmidt (UFRGS) & R. Reis (UFRGS)9- Automatic Tools for Design Hardening, C. Lopez-Ongill, L. Entrena, M. Gracia-Valderas, M. Portela-Garcia (Univ. Carlos III) 10- Test Facilities for SEE and Dose Testing, S. Duzellier (ONERA) and G. Berger (UCL)11- Error Rate Prediction of Digital Architectures: Test Methodology and Tools, R. Velazco, F, Faure (TIMA)12- Using the SEEM Software for Laser SET Testing and Analysis, V. Pouget, P. Fouillat, D. Lewis (IXL)