Scanning and Transmission Electron Microscopy: An Introduction

Hardcover | April 30, 1999

byStanley L. Flegler, John W. Heckman, Karen L. Klomparens

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This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide youthrough microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique bookcovers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmissionelectron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.

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This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide youthrough microscope operation, image production, an...

Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.
Format:HardcoverDimensions:240 pages, 8.19 × 10.24 × 0.71 inPublished:April 30, 1999Publisher:Oxford University Press

The following ISBNs are associated with this title:

ISBN - 10:0195107519

ISBN - 13:9780195107517

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Table of Contents

1. Introduction2. Electron Sources and Electron Lenses2.1. Electron Sources2.2. Electron Lenses3. Vacuum Systems3.1. Vacuum Pumps Commonly Used in EM Labs3.2. Methods of Measuring Vacuums3.3. Vacuum Systems Used in Electron Microscopy4. The Transmission Electron Microscope4.1. Theory of Operation4.2. Real Images4.3. Virtual Images4.4. Depth of Field and Depth of Focus4.5. Anatomy of a Transmission Electron Microscope4.6. Medium- and High-Voltage Transmission Electron Microscopy5. The Scanning Electron Microscope5.1. Theory of Operation5.2. Specimen-Beam Interactions5.3. Machine Variables5.4. Ultrahigh-Resolution SEMS5.5. Environmental SEMS5.7. Scanning Tunneling and Atomic Force Microscopy6. Specimen Preparation for TEM6.1. Negative Staining of Small Particulates6.2. Ultrathin Sectioning of Larger Samples6.3. Vacuum Evaporators and Evaporation Techniques6.4. Shadowcasting and Replica Techniques6.5. Cytological Techniques6.6. Preparation of Nonbiological Materials7. Specimen Preparation for SEM7.1. Mounting7.2. Coating for Conductivity7.3. Special Methods for Various Sample Types7.4. Biological Sample Preparation7.5. Alternative Methods for Biological Samples7.6. SEM Histochemistry for Biological Samples8. X-Ray Analysis8.1. X-ray Production and Naming8.2. Measuring the Energy and Wavelength of X Rays8.3. Construction of the EDS Detector8.4. Construction of the EDS X-Ray Analyzer8.5. Outputs8.6. Spectrum Accumulation and Interpretation8.7. Optimizing the Detection of X Rays8.8. Artifacts8.9. Quantitative Analysis8.10. Sample Preparation9. Electron Micrographic Techniques9.1. Silver Graphic Process9.2. Photographic Printing9.3. Transmission Electron Micrography9.4. Scanning Electron Micrography9.5. The Electronic Darkroom9.6. Micrograph Presentation and Publication

Editorial Reviews

"Presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Explanations coupled with diagrams and photographs guide the reader." --Journal of Chemical Education