Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

Hardcover | October 1, 1993

byDror Sarid

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Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materialsscience, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mappingof a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book anexcellent introduction to this rapidly developing field.

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From the Publisher

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materialsscience, bio-science, and data storage media. ...

Dror Sarid is at University of Arizona-Tucson.

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Kobo ebook|May 6 2010

$88.99 online$115.49list price(save 22%)
Format:HardcoverDimensions:288 pages, 9.49 × 6.38 × 0.91 inPublished:October 1, 1993Publisher:Oxford University Press

The following ISBNs are associated with this title:

ISBN - 10:019509204X

ISBN - 13:9780195092042

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Table of Contents

PART ONE: LEVERS AND NOISE1. Mechanical Properties of Levers2. Resonance Enhancement3. Sources of NoisesPART TWO: SCANNING FORCE MICROSCOPES4. Tunneling Detection Systems5. Capacitance Detection Systems6. Homodyne Detection Systems7. Heterodyne Detection Systems8. Laser-Diode Feedback Detection Systems9. Polarization Detection Systems10. Deflection Detection SystemsPART THREE: SCANNING FORCE MICROSCOPY11. Electric Force Microscopy12. Magnetic Force Microscopy13. Atomic Force Microscopy

Editorial Reviews

"Presents a theoretical background for scanning force microscopy (SFM) starting from first principles, with experimental and technical information incorporated into each chapter."--Materials Research Bulletin