Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

October 13, 2014|
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis by Nobuo Tanaka
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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Title:Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And AnalysisFormat:HardcoverProduct dimensions:616 pages, 9.41 X 7.24 X 0.98 inShipping dimensions:616 pages, 9.41 X 7.24 X 0.98 inPublished:October 13, 2014Publisher:World Scientific PublishingLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:184816789X

ISBN - 13:9781848167896

Appropriate for ages: All ages

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