Surface Analysis by Electron Spectroscopy: Measurement and Interpretation by Graham C. SmithSurface Analysis by Electron Spectroscopy: Measurement and Interpretation by Graham C. Smith

Surface Analysis by Electron Spectroscopy: Measurement and Interpretation

byGraham C. Smith

Hardcover | November 30, 1994

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The textbooks in this acclaimed series introduce the nonspecialist to the fundamentals and recent developments of a particular field. The current volume focuses on Auger electron spectroscopy and X-ray photoelectron spectroscopy, with an emphasis on current applications. Physicists, chemists, and materials scientists will learn principles of operation, some design theory, and assessment techniques.

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Title:Surface Analysis by Electron Spectroscopy: Measurement and InterpretationFormat:HardcoverDimensions:167 pages, 9.25 × 6.1 × 0.01 inPublished:November 30, 1994Publisher:Springer US

The following ISBNs are associated with this title:

ISBN - 10:0306448068

ISBN - 13:9780306448065

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Table of Contents

Surface Analysis by Electron Spectroscopy. Experimental Aspects of AES and XPS. Data Processing for AES and XPS. Quantification of Data from Homogenous Materials. Structural Information from Inhomogenous Samples. Trends in Surface Analysis. Index.