Surface Infrared and Raman Spectroscopy: Methods and Applications by W. SuëtakaSurface Infrared and Raman Spectroscopy: Methods and Applications by W. Suëtaka

Surface Infrared and Raman Spectroscopy: Methods and Applications

byW. SuëtakaContribution byJohn T. Yates Jr.

Hardcover | May 31, 1995

Pricing and Purchase Info

$205.29 online 
$233.95 list price save 12%
Earn 1,026 plum® points

Prices and offers may vary in store

Quantity:

In stock online

Ships free on orders over $25

Not available in stores

about

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur­ faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di­ verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.
Title:Surface Infrared and Raman Spectroscopy: Methods and ApplicationsFormat:HardcoverDimensions:283 pagesPublished:May 31, 1995Publisher:Springer US

The following ISBNs are associated with this title:

ISBN - 10:0306449633

ISBN - 13:9780306449635

Look for similar items by category:

Reviews

Table of Contents

1. Introduction.- 2. Infrared External Reflection Spectroscopy.- 3. Internal Reflection Spectroscopy.- 4. Infrared Emission Spectroscopy.- 5. Surface Raman Spectroscopy.- 6. Surface Enhanced Raman Scattering.