Trap Level Spectroscopy in Amorphous Semiconductors

Other | June 11, 2010

byVictor V. Mikla, Victor V. Mikla, Victor I. Mikla

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Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.

  • Provides information on the most used spectroscopic techniques
  • Discusses the advantages and disadvantages of each technique

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Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.Provides information on the most used spectroscopic techniquesDiscusses the advantages ...

Victor I. Mikla, PhD, is Chair of Physical & Mathematical Disciplines in the Department of Humanities & Natural Sciences at Uzhhgorod National University, Uzhhorod, Ukraine. Dr. Mikla specializes in photo-electronic materials and devices, and has published research articles widely on a broad range of inter-disciplinary topics including...

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Trap Level Spectroscopy in Amorphous Semiconductors
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Format:OtherDimensions:128 pages, 1 × 1 × 1 inPublished:June 11, 2010Publisher:Elsevier Science & TechLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0123847168

ISBN - 13:9780123847164

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Table of Contents

  1. Introduction
  2. Thermally stimulated depolarization currents in amorphous chalcogenides
  3. Carrier transport processes in amorphous solids
  4. Time-of-flight experiments in amorphous chalcogenide semiconductors
  5. Xerographic spectroscopy of states in mobility gap
  6. Photoinduced effects on states in the mobility gap
  7. Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors