VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings by Manoj Singh GaurVLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings by Manoj Singh Gaur

VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013…

byManoj Singh GaurEditorMark Zwolinski, Vijay Laxmi

Paperback | December 10, 2013

Pricing and Purchase Info

$92.97 online 
$110.50 list price save 15%
Earn 465 plum® points

Prices and offers may vary in store

Quantity:

In stock online

Ships free on orders over $25

Not available in stores

about

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Title:VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013…Format:PaperbackDimensions:388 pagesPublished:December 10, 2013Publisher:Springer-Verlag/Sci-Tech/TradeLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:3642420230

ISBN - 13:9783642420238

Look for similar items by category:

Reviews

Table of Contents

VLSI design.- Testing and verification.- Embedded systems.- Emerging technology.