Vlsi Test Principles And Architectures: Design For Testability

Other | August 1, 2006

byWang, Laung-Terng, Laung-terng Wang, Cheng-Wen Wu...

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
  • Most up-to-date coverage of design for testability.
  • Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
  • Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

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From the Publisher

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in comme...

Format:OtherDimensions:808 pages, 1 × 1 × 1 inPublished:August 1, 2006Publisher:Morgan KaufmannLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:0080474799

ISBN - 13:9780080474793

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Extra Content

Table of Contents

Chapter 1 - Introduction
Chapter 2 - Design for Testability
Chapter 3 - Logic and Fault Simulation
Chapter 4 - Test Generation
Chapter 5 - Logic Built-In Self-Test
Chapter 6 - Test Compression
Chapter 7 - Logic Diagnosis
Chapter 8 - Memory Testing and Built-In Self-Test
Chapter 9 - Memory Diagnosis and Built-In Self-Repair
Chapter 10 - Boundary Scan and Core-Based Testing
Chapter 11 - Analog and Mixed-Signal Testing
Chapter 12 - Test Technology Trends in the Nanometer Age