X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures by Martin SchmidbauerX-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures by Martin Schmidbauer

X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

byMartin Schmidbauer

Paperback | December 1, 2010

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This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

Title:X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor StructuresFormat:PaperbackDimensions:204 pagesPublished:December 1, 2010Publisher:Springer-Verlag/Sci-Tech/TradeLanguage:English

The following ISBNs are associated with this title:

ISBN - 10:3642057691

ISBN - 13:9783642057694

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Table of Contents

A Brief Introduction to the Topic.- Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures.- Experimental Optimization.- A Model System: LPE SiGe/Si(001) Islands.- Dynamical Scattering at Grazing Incidence.- Characterization of Quantum Dots.- Characterization of Interface Roughness.- Appendix.