X-Ray Spectrometry in Electron Beam Instruments by Joseph GoldsteinX-Ray Spectrometry in Electron Beam Instruments by Joseph Goldstein

X-Ray Spectrometry in Electron Beam Instruments

EditorJoseph Goldstein, Dale E. Newbury, David B. Williams

Hardcover | March 31, 1995

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This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.
Title:X-Ray Spectrometry in Electron Beam InstrumentsFormat:HardcoverDimensions:390 pagesPublished:March 31, 1995Publisher:Springer US

The following ISBNs are associated with this title:

ISBN - 10:0306448580

ISBN - 13:9780306448584


Table of Contents

The Development of Energy Dispersive Electron Probe Analysis; K.F.J. Heinrich. Problems and Trends in X-ray Detector Design for Microanalysis; B.G. Lowe. New Materials for Thin Windows; M.W. Lund. Intrinsic Ge Detectors; R. Sareen. Modeling the Energy-dispersive X-ray Detector; D.C. Joy. The Effect of Detector Dead Layers on Light Element Detection; J.J. McCarthy. Energy-dispersive X-ray Spectrometry in Ultra-high Vacuum Environments; J.R. Michael. Quantifying Benefits of Resolution and Count Rate in EDX Microanalysis; P.J. Statham. Improving EDS Performance with Digital Pulse Processing; R.B. Mott, J.J. Friel. A Study of Systematic Errors in Multiple Linear Regression Peak Fitting Using Generated Spectra; C.R. Swyt. Artifacts in Energy-dispersive X-ray Spectrometry in Electron Beam Instruments: Are Things Getting Any Better?; D.E. Newbury. Characterizing an Energy-dispersive Spectrometer on an Analytical Electron Microscope; S.M. Zemyan, D.B. Williams. Wavelength Dispersive Spectrometry - A Review; S.J.B. Reed. Synthetic Multilayer Crystals for EPMA of Ultralight Elements; G.F. Bastin, H.J.M. Heijligers. 4 additional articles. Index.

Editorial Reviews

`[A] rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension.' from the Foreword by Peter Duncumb, University of Cambridge, England `Contains a vast amount of detailed information and will surely be heavily used.' Ultramicroscopy